For semiconductor engineers making wafer-level measurements in R&D and production environments, FemtoTek delivers software tools for fast implementation of PC based measurement solutions. With our tools, PCs programmed in LabVIEW, .NET or LabWindows/CVI can be used for complex, yet cost effective, measurements. Our software tools include:

• Prober Drivers (LabVIEW, .NET, and LabWindows/CVI)
• Wafer Map Software (LabVIEW & .NET)
• Probe Plan Editor (LabVIEW & .NET)
• Measurement Toolkits (LabVIEW)

These tools are useful both for wafer-level electrical measurements, and optical measurements.

Examples of measurement applications that are best solved with PC-based solutions include:

• SOC mixed signal measurements
• LED and laser device measurements
• Wafer parametric measurements
• MEMs measurements
• ADC converter measurements
• Hall effect devices
• Optical thickness measurements

FemtoTek has supplied software to most large semiconductor ATE vendors and a large number of device manufacturers.