Software for Test, Measurement and Control
Applications, System Design, Network, Data Management
Toolkits for Semiconductor Test
Probe Control Toolkit Probe Control Toolkit FemtoTek's Prober Control Framework is a LabVIEW-based program for operating a wafer prober. The prober control functions allow both manual and automatic operation. In manual mode, button clicks on the operator panel perform single prober functions. In automatic mode the user can load a probe plan list of die sites and start automatic move and measure sequencing across the wafer. The control framework is used in combination with a model specific prober driver. (View Product Description, Request a Quote)

IV Toolkit IV Measurement Toolkit The IV-Engine is a LabVIEW-based test sequencer for measuring semiconductor IV data . The IV-Engine has a flexible editing screen that allows the user to configure both point measurements and sweeps. The individual measurement setups can then be combined in a sequence. (View Product Description, Request a Quote)

RF Toolkit RF Measurement Toolkit The RF-Engine is a LabVIEW-based test sequencer for measuring semiconductor s-parameter data . The RF-Engine has a flexible editing screen that allows the user to configure both calibration and measurement sweep. The individual measurement setups can then be combined in a sequence. (View Product Description, Request a Quote)

Semiconductor wafer LabVIEW Characterization Toolkit contains shmoo plot and margin analysis characterization tools designed to assist design and test engineers in design evaluation and yield improvement of ICs and electronic devices. The tools build on the low-cost flexible environment provided by National Instrument's LabVIEW. (View Product Description, Request a Quote)


Companion products include Wafer Map and Probeplan Editor (Utilities), and prober drivers (Probers)

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