For engineers who need an integrated, PC-based semiconductor measurement application on a LabVIEW or .NET platform, FemtoTek provides rapid implementation of modular test software.

Successful implementation requires knowledge of software tools, instrument architecture and measurement techniques, and device physics.

Our structured software engineering approach plus our in-depth understanding of the interaction between instruments results in high-quality, reliable software that can be leveraged to cover future requirements.

We have extensive experience with measurement software for various types of semiconductor devices: memory, embedded memory, microprocessor, mixed signal and SOC. This experience also covers specialized semiconductors: MEMS, LEDs, MMICs.

We have experience in the complete range of precision electrical measurements from DC to microwave frequencies. Measurement instruments that we support include:

• Keithley 2700, Keithley 2750 multimeter, data acquisition and switching systems
• Keithley 2600 sourcemeter, Keithley 2400 sourcemeter, Keithley 2000 multimeter
• Keithley 7001, Keithley 7002 switching systems
• Keithley TSP link, Keithley TSP scripts, Keithley trigger link
• National Instruments PXI, RF and data acquisitions systems
• Agilent network analyzers, Agilent spectrum analyzers
• Agilent oscilloscopes, Agilent DCA digital communication analyzers
• Tektronix oscillopes, Textronix VXI